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Recombination Lifetime Measurements in Silicon

By: Gupta , C DineshMaterial type: Text

TextOriginal language: English Publication details: America: American Society For Testing And Meterials, 1998Description: 392 p. ; 23.3 cmISBN: 0803124899Subject(s): Engineering & Allied OperationDDC classification: 621.38

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Holdings
Item type	Current library	Call number	Status	Date due	Barcode
Lending General Book	Senarath Paranavithana Public Library Adults - Reference Section	621.38 Gup (Browse shelf(Opens below))	Available		26526

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