Normal view MARC view ISBD view

Recombination Lifetime Measurements in Silicon

Gupta , C Dinesh

Recombination Lifetime Measurements in Silicon - America: American Society For Testing And Meterials, 1998. - 392 p. ; 23.3 cm.

ISBN: 0803124899

Subjects--Topical Terms:
Engineering & Allied Operation

Dewey Class. No.: 621.38 / Gup

Print
Add to your cart (remove)
Suggest for purchase
Save record
BIBTEX Dublin Core MARCXML MARC (non-Unicode/MARC-8) MARC (Unicode/UTF-8) MARC (Unicode/UTF-8, Standard) MODS (XML) RIS ISBD
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com) Open Library (openlibrary.org)