Recombination Lifetime Measurements in Silicon (Record no. 21135)
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| 000 -LEADER | |
|---|---|
| fixed length control field | 00466nam a22001577a 4500 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION | |
| fixed length control field | 181104b ||||| |||| 00| 0 eng d |
| 020 ## - ISBN | |
| International Standard Book Number | 0803124899 |
| 041 ## - LANGUAGE CODE | |
| Language code of original | eng |
| 082 ## - DEWEY DECIMAL CLASSIFICATION NUMBER | |
| Classification number | 621.38 |
| Item number | Gup |
| 100 ## - MAIN ENTRY--PERSONAL NAME | |
| Personal name | Gupta , C Dinesh |
| 245 ## - TITLE STATEMENT | |
| Title | Recombination Lifetime Measurements in Silicon |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. | |
| Place of publication, distribution, etc. | America: |
| Name of publisher, distributor, etc. | American Society For Testing And Meterials, |
| Date of publication, distribution, etc. | 1998. |
| 300 ## - PHYSICAL DESCRIPTION | |
| Extent | 392 p. |
| Other physical details | ; |
| Dimensions | 23.3 cm. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| Topical term or geographic name entry element | Engineering & Allied Operation |
| 942 ## - | |
| Koha item type | Reference Book |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM | |
| -- | 45846 |
| Withdrawn status | Lost status | Source of classification or shelving scheme | Damaged status | Not for loan | Home library | Current library | Shelving location | Date acquired | Cost, normal purchase price | Full call number | Barcode | Koha item type |
|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Senarath Paranavithana Public Library | Senarath Paranavithana Public Library | Adults - Reference Section | 04/11/2018 | 0.00 | 621.38 Gup | 26526 | Lending General Book |
